photoemission造句
1. Inverse Photoemission Spectroscopy(IPES)gives the possibility to investigate directly the unoccupied electronic states of a solid surface.
2. The angle_resolved photoemission (ARPES) is a powerful experiment method to study the surface electronic structure of crystals, such as energy bands, Fermi surface, and many_body interaction.
3. Phase evolution was studied by the synchrotron radiation photoemission technique.
4. In chapter 2, we review the history of photoemission study about the copper oxide high-temperature superconductors copper oxides.
5. Based on photoemission effect. we design a laser photoemission electron gun for electron impact ionization source of time of flight mass spectrometer.
6. The equation of Einstein photoemission can fully explain experimental rule of photoemission.
7. The principle of GaAs photoemission polarized electrons and a very simple kind of GaAs polarized electron source are introduced in this paper.
8. Besides, we use ultraviolet photoemission spectroscopy to measure the unoccupied states of the materials.
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9. This paper briefly introduces the basic principles to measure plancks constant by photoemission and the three methods to measure cut-off voltage.
10. The photocathode consists of a substrate (involving a conductive base film for dielectric cathode) and a photoemission film.
11. The energy band structure of the sample was measured at low temperature using the synchrotron radiation photoemission spectrum technique.
12. This paper describes the influence of applied electric-field on the photoemission of photocathodes.
13. The theoretical results have been verified by both the experimental photoemission spectra and ground-state properties, as well as the superconductivity data.
14. The energy levels calculated with the TNP, DNP and DND basis sets can play important roles in analyzing light absorption and photoemission experiments.
15. It can be used as the current detector in the experiment of bridge measurement, thermoelectricity field, electromagnetic, photoemission.
16. Two methods used in the microanalysis of semiconductor interfaces, Ballistic Electron Emission Microscopy (BEEM)and Scanning Internal Photoemission Microscopy (SIPM), are described.
17. The chemical structures of the films which are prepared under different conditions are analyzed with X-ray photoemission spectroscopy.
18. It shows good consistence between the calculated results with the measured ultraviolet photoemission spectroscopy (UPS) results.
19. This article introduces the technical index about the measurer of a new Planck constant and the methods of demonstrating photoemission phenomenon and measuring Planck constant.